CMT-SR2000N Resistivity Measurement System

Sample Size: Up to 200mm dia or 140mm sq


The CMT-SR2000N and CMT-SR2000N-PV is a fully automatic system to measure Sheet Resistance and Resistivity of Silicon Wafer. This system can be operated by itself, furthermore, perfect remote control is available using a PC and exclusive software, and it gives various data analyses.     




X,Y,Z axes fully automatic system 
Auto & Manual range selection 
Systems for PV wafer SR-2000N-PV: 156mm x 156mm 
Perfect remote control by operating software
Data analysis (2D, 3D map, Data map, etc)
ASTM & SEMI quick measurement mode